Browsing by Author Güneş, Mehmet


Or, select a letter below to browse by last name
0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Showing results 1 to 20 of 22  next >
Issue DateTitleAuthor(s)
20031/f noise in amorphous silicon and silicon-germanium alloysJohanson, Robert E.; Güneş, Mehmet ; Kasap, Safa O.
May-20001/f Noise in doped and undoped amorphous siliconJohanson, Robert E.; Güneş, Mehmet ; Kasap, Safa O.
Aug-20031/f noise in hydrogenated amorphous silicon-germanium alloysJohanson, Robert E.; Güneş, Mehmet ; Kasap, Safa O.
19991/f-noise study of undoped intrinsic hydrogenated amorphous silicon thin filmsGüneş, Mehmet ; Johanson, Robert E.; Kasap, Safa O.
Oct-2003Conductance fluctuations in a-Si:H: Effects of alloying and device structureKasap, Safa O.; Güneş, Mehmet ; Johanson, Robert E.; Wang, Q.; Yang, Jeffrey; Guha, Subhendu
Apr-2002Conductance fluctuations in undoped hydrogenated amorphous silicon-germanium alloy thin filmsGüneş, Mehmet ; Johanson, Robert E.; Kasap, Safa O.; Yang, Jeffrey C.; Guha, Subhendu
May-2000Conductance fluctuations in undoped intrinsic hydrogenated amorphous silicon films prepared using several deposition techniquesGüneş, Mehmet ; Johanson, Robert E.; Kasap, Safa O.
Oct-2003Conductance fluctuations in VHF-PECVD grown hydrogenated microcrystalline silicon thin filmsGüneş, Mehmet ; Johanson, Robert E.; Kasap, Safa O.; Finger, Friedhelm; Lambertz, Andreas
Apr-1997Differences in the densities of charged defect states and kinetics of Staebler-Wronski effect in undoped (nonintrinsic) hydrogenated amorphous silicon thin filmsGüneş, Mehmet ; Wronski, Christopher R.
Apr-2006Diffusion length measurements of microcrystalline silicon thin films prepared by hot-wire/catalytic chemical vapor deposition (HWCVD)Okur, Salih ; Güneş, Mehmet ; Finger, Friedhelm; Carius, Reinhard
Feb-2010The effects of native and light induced defects on optoelectronic properties of hydrogenated amorphous silicon-germanium (a-SiGe:H) alloy thin filmsGüneş, Mehmet ; Yavaş, Mert; Klomfaß, Josef; Finger, Friedhelm
Feb-2005The effects of oxide thickness on the interface and oxide properties of metal-tantalum pentoxide-Si (MOS) capacitorsÖzdağ, Pınar; Atanassova, Elena; Güneş, Mehmet 
Mar-2004Electronic transport properties of microcrystalline silicon thin films prepared by VHF-PECVDOkur, Salih ; Güneş, Mehmet ; Göktaş, Oktay; Finger, Friedhelm; Carius, Reinhard
Feb-2005Instability phenomena in microcrystalline silicon filmsFinger, Friedhelm; Carius, Reinhard; Dylla, Thorsten; Klein, Stefan; Okur, Salih ; Güneş, Mehmet 
Feb-2005Light induced degradation of hydrogenated amorphous silicon - Germanium alloy (a-SiGe:H) thin filmsDönertaş, M. Elif; Güneş, Mehmet 
Feb-2005Minority carrier properties of microcrystalline silicon thin films grown by HW-CVD and VHF-PECVD techniquesOkur, Salih ; Göktaş, Oktay; Güneş, Mehmet ; Finger, Friedhelm; Carius, Reinhard
1997Native and light induced defect states in wide band gap hydrogenated amorphous silicon-carbon (a-Si1-xCx : H) alloy thin filmsGüneş, Mehmet 
2002Noise in hydrogenated amorphous siliconJohanson, Robert E.; Güneş, Mehmet ; Kasap, Safa O.
Oct-2003Photoconductivity spectroscopy in hydrogenated microcrystalline silicon thin filmsGüneş, Mehmet ; Akdaş, Deniz; Göktaş, Oktay; Carius, Reinhard; Klomfaß, Josef; Finger, Friedhelm
Aug-2003Stability of microcrystalline silicon for thin film solar cell applicationsFinger, Friedhelm; Carius, Reinhard; Dylla, Thorsten; Klein, Stefan; Okur, Salih ; Güneş, Mehmet