Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/6078
Title: Surface roughness estimation of MBE grown CdTe/GaAs(211)B by ex-situ spectroscopic ellipsometry
Authors: Karakaya, Merve
Bilgilisoy, Elif
Arı, Ozan
Selamet, Yusuf
Keywords: Cadmium telluride
Ellipsometry
Optical correlation
Surface roughness
Spectroscopic ellipsometry
Issue Date: 1-Jul-2016
Publisher: American Institute of Physics
Source: Karakaya, M., Bilgilisoy, E., Arı, O., and Selamet, Y. (2016). Surface roughness estimation of MBE grown CdTe/GaAs(211)B by ex-situ spectroscopic ellipsometry. AIP Advances, 6(7). doi:10.1063/1.4959223
Abstract: Spectroscopic ellipsometry (SE) ranging from 1.24 eV to 5.05 eV is used to obtain the film thickness and optical properties of high index (211) CdTe films. A three-layer optical model (oxide/CdTe/GaAs) was chosen for the ex-situ ellipsometric data analysis. Surface roughness cannot be determined by the optical model if oxide is included. We show that roughness can be accurately estimated, without any optical model, by utilizing the correlation between SE data (namely the imaginary part of the dielectric function, <ϵ2 > or phase angle, ψ) and atomic force microscopy (AFM) roughness. <ϵ2 > and ψ values at 3.31 eV, which corresponds to E1 critical transition energy of CdTe band structure, are chosen for the correlation since E1 gives higher resolution than the other critical transition energies. On the other hand, due to the anisotropic characteristic of (211) oriented CdTe surfaces, SE data (<ϵ2 > and ψ) shows varieties for different azimuthal angle measurements. For this reason, in order to estimate the surface roughness by considering these correlations, it is shown that SE measurements need to be taken at the same surface azimuthal angle. Estimating surface roughness in this manner is an accurate way to eliminate cumbersome surface roughness measurement by AFM.
URI: http://doi.org/10.1063/1.4959223
http://hdl.handle.net/11147/6078
ISSN: 2158-3226
2158-3226
Appears in Collections:Materials Science and Engineering / Malzeme Bilimi ve Mühendisliği
Physics / Fizik
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection

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