Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/5962
Title: Exploiting model morphology for event-based testing
Authors: Belli, Fevzi
Beyazıt, Mutlu
Belli, Fevzi
Izmir Institute of Technology. Computer Engineering
Keywords: Grammar-based testing
Model based testing
Mutant selection
Software testing
Computational grammars
Issue Date: 1-Feb-2015
Publisher: Institute of Electrical and Electronics Engineers Inc.
Source: Belli, F., and Beyazıt, M. (2015). Exploiting model morphology for event-based testing. IEEE Transactions on Software Engineering, 41(2), 113-134. doi:10.1109/TSE.2014.2360690
Abstract: Model-based testing employs models for testing. Model-based mutation testing (MBMT) additionally involves fault models, called mutants, by applying mutation operators to the original model. A problem encountered with MBMT is the elimination of equivalent mutants and multiple mutants modeling the same faults. Another problem is the need to compare a mutant to the original model for test generation. This paper proposes an event-based approach to MBMT that is not fixed on single events and a single model but rather operates on sequences of events of length k ≥ 1 and invokes a sequence of models that are derived from the original one by varying its morphology based on k. The approach employs formal grammars, related mutation operators, and algorithms to generate test cases, enabling the following: (1) the exclusion of equivalent mutants and multiple mutants; (2) the generation of a test case in linear time to kill a selected mutant without comparing it to the original model; (3) the analysis of morphologically different models enabling the systematic generation of mutants, thereby extending the set of fault models studied in related literature. Three case studies validate the approach and analyze its characteristics in comparison to random testing and another MBMT approach.
URI: https://doi.org/10.1109/TSE.2014.2360690
http://hdl.handle.net/11147/5962
ISSN: 0098-5589
Appears in Collections:Computer Engineering / Bilgisayar Mühendisliği
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection

Files in This Item:
File Description SizeFormat 
5962.pdfMakale1.06 MBAdobe PDFThumbnail
View/Open
Show full item record

CORE Recommender

SCOPUSTM   
Citations

8
checked on Sep 18, 2021

WEB OF SCIENCETM
Citations

5
checked on Sep 18, 2021

Page view(s)

20
checked on Sep 18, 2021

Download(s)

22
checked on Sep 18, 2021

Google ScholarTM

Check

Altmetric


Items in GCRIS Repository are protected by copyright, with all rights reserved, unless otherwise indicated.