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https://hdl.handle.net/11147/5962
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DC Field | Value | Language |
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dc.contributor.author | Belli, Fevzi | - |
dc.contributor.author | Beyazıt, Mutlu | - |
dc.date.accessioned | 2017-07-19T11:33:37Z | - |
dc.date.available | 2017-07-19T11:33:37Z | - |
dc.date.issued | 2015-02-01 | - |
dc.identifier.citation | Belli, F., and Beyazıt, M. (2015). Exploiting model morphology for event-based testing. IEEE Transactions on Software Engineering, 41(2), 113-134. doi:10.1109/TSE.2014.2360690 | en_US |
dc.identifier.issn | 0098-5589 | - |
dc.identifier.uri | https://doi.org/10.1109/TSE.2014.2360690 | - |
dc.identifier.uri | http://hdl.handle.net/11147/5962 | - |
dc.description.abstract | Model-based testing employs models for testing. Model-based mutation testing (MBMT) additionally involves fault models, called mutants, by applying mutation operators to the original model. A problem encountered with MBMT is the elimination of equivalent mutants and multiple mutants modeling the same faults. Another problem is the need to compare a mutant to the original model for test generation. This paper proposes an event-based approach to MBMT that is not fixed on single events and a single model but rather operates on sequences of events of length k ≥ 1 and invokes a sequence of models that are derived from the original one by varying its morphology based on k. The approach employs formal grammars, related mutation operators, and algorithms to generate test cases, enabling the following: (1) the exclusion of equivalent mutants and multiple mutants; (2) the generation of a test case in linear time to kill a selected mutant without comparing it to the original model; (3) the analysis of morphologically different models enabling the systematic generation of mutants, thereby extending the set of fault models studied in related literature. Three case studies validate the approach and analyze its characteristics in comparison to random testing and another MBMT approach. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | en_US |
dc.relation.ispartof | IEEE Transactions on Software Engineering | en_US |
dc.rights | info:eu-repo/semantics/openAccess | en_US |
dc.subject | Grammar-based testing | en_US |
dc.subject | Model based testing | en_US |
dc.subject | Mutant selection | en_US |
dc.subject | Software testing | en_US |
dc.subject | Computational grammars | en_US |
dc.title | Exploiting model morphology for event-based testing | en_US |
dc.type | Article | en_US |
dc.institutionauthor | Belli, Fevzi | - |
dc.department | İzmir Institute of Technology. Computer Engineering | en_US |
dc.identifier.volume | 41 | en_US |
dc.identifier.issue | 2 | en_US |
dc.identifier.startpage | 113 | en_US |
dc.identifier.endpage | 134 | en_US |
dc.identifier.wos | WOS:000351460400001 | en_US |
dc.identifier.scopus | 2-s2.0-84923068858 | en_US |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
dc.identifier.doi | 10.1109/TSE.2014.2360690 | - |
dc.relation.doi | 10.1109/TSE.2014.2360690 | en_US |
dc.coverage.doi | 10.1109/TSE.2014.2360690 | en_US |
local.message.claim | 2022-06-03T14:16:59.009+0300 | * |
local.message.claim | |rp00375 | * |
local.message.claim | |submit_approve | * |
local.message.claim | |dc_contributor_author | * |
local.message.claim | |None | * |
dc.identifier.wosquality | Q1 | - |
dc.identifier.scopusquality | Q1 | - |
item.fulltext | With Fulltext | - |
item.grantfulltext | open | - |
item.languageiso639-1 | en | - |
item.openairecristype | http://purl.org/coar/resource_type/c_18cf | - |
item.cerifentitytype | Publications | - |
item.openairetype | Article | - |
crisitem.author.dept | 03.04. Department of Computer Engineering | - |
Appears in Collections: | Computer Engineering / Bilgisayar Mühendisliği Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection |
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