Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/5453
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dc.contributor.authorCoutts, Michael J.-
dc.contributor.authorZareie, Hadi M.-
dc.contributor.authorCortie, Michael B.-
dc.contributor.authorMcDonagh, Andrew Michael-
dc.date.accessioned2017-05-05T08:32:01Z
dc.date.available2017-05-05T08:32:01Z
dc.date.issued2014-04
dc.identifier.citationCoutts, M.J., Zareie, H.M., Cortie, M.B., and McDonagh, A.M. (2014). Charging of gold/metal oxide/gold nanocapacitors in a scanning electron microscope. Nanotechnology, 25(15). doi:10.1088/0957-4484/25/15/155703en_US
dc.identifier.issn0957-4484
dc.identifier.issn0957-4484-
dc.identifier.issn1361-6528-
dc.identifier.urihttps://doi.org/10.1088/0957-4484/25/15/155703
dc.identifier.urihttp://hdl.handle.net/11147/5453
dc.description.abstractTriangular parallel-plate nanocapacitors were fabricated by a combination of microsphere lithography and physical vapor deposition. The devices were comprised of a 20 nm layer of dielectric material sandwiched between two 20 nm layers of gold. Dielectric materials with a range of relative permittivities were investigated. Charging of the capacitors was probed in a scanning electron microscope (SEM) by monitoring the change in brightness of the images of the devices as a function of time. The time constants, RC, associated with the charging of the capacitors, were extracted from the SEM grayscale data. The resulting average RC values were 248 ± 27 s for SiO2, 70 ± 8 s for Al2O3, 113 ± 80 s for ZnO and 125 ± 13 s for HfO2. These values are consistent with the anticipated RC values based on the resistivities and permittivities of the materials used in the devices and importantly, were measured without the need to attach any wires or leads.en_US
dc.description.sponsorshipAustralian Research Council (DP0877539-DP0984354)en_US
dc.language.isoenen_US
dc.publisherIOP Publishing Ltd.en_US
dc.relation.ispartofNanotechnologyen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectChargingen_US
dc.subjectNanocapacitorsen_US
dc.subjectNanosphere lithographyen_US
dc.subjectScanning electron microscopyen_US
dc.subjectDielectric materialsen_US
dc.titleCharging of gold/metal oxide/gold nanocapacitors in a scanning electron microscopeen_US
dc.typeArticleen_US
dc.institutionauthorZareie, Hadi M.-
dc.departmentİzmir Institute of Technology. Materials Science and Engineeringen_US
dc.identifier.volume25en_US
dc.identifier.issue15en_US
dc.identifier.wosWOS:000333394100013en_US
dc.identifier.scopus2-s2.0-84897893386en_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.identifier.doi10.1088/0957-4484/25/15/155703-
dc.identifier.pmid24651283en_US
dc.relation.doi10.1088/0957-4484/25/15/155703en_US
dc.coverage.doi10.1088/0957-4484/25/15/155703en_US
dc.identifier.wosqualityQ1-
dc.identifier.scopusqualityQ1-
item.languageiso639-1en-
item.cerifentitytypePublications-
item.grantfulltextopen-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.openairetypeArticle-
item.fulltextWith Fulltext-
Appears in Collections:Materials Science and Engineering / Malzeme Bilimi ve Mühendisliği
PubMed İndeksli Yayınlar Koleksiyonu / PubMed Indexed Publications Collection
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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