Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/9095
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dc.contributor.authorAras, Nadir-
dc.contributor.authorYalçın, Şerife-
dc.date.accessioned2020-07-25T22:03:45Z-
dc.date.available2020-07-25T22:03:45Z-
dc.date.issued2019-
dc.identifier.issn0584-8547-
dc.identifier.urihttps://doi.org/10.1016/j.sab.2018.12.013-
dc.identifier.urihttps://hdl.handle.net/11147/9095-
dc.description.abstractThis work communicates a critical assessment on the analytical capability of the three silicon wafer-based substrates; crystalline silicon (c-Si), oxide-coated silicon (SiO2-Si), and nitride-coated silicon (Si3N4-Si), for dried-droplet analysis by laser-induced breakdown spectroscopy. The methodology consists of loading, drying and analyzing steps. First, nanoliter volume of droplets are manually loaded onto the substrate and dried at room temperature. Then, the dry residue is subjected to high peak power (1.15 GW/cm(2)) laser pulses focused outside the minimum focal point condition and luminescent plasma is spectroscopically analyzed. Results revealed that nitride-coated substrate exhibits strong enhancements in signal intensity for most emission lines of the analyte species investigated: Cd, Cr, Cu, Mn, and Pb. Surface reflectivity and surface morphology were comparatively investigated to explore enhanced analytical performance of nitride-coated substrates. Experimental conditions were optimized and growth curves for all the elements are found linear with minimum regression constant of 0.96. LOD's of 62 pg Cd, 1.5 pg Cr, 0.5 pg Cu, 2 pg Mn and 11 pg Pb, in absolute amounts, were obtained. The accuracy and precision of the methodology were tested on certified reference water sample (CRM-TMDW), and ICP-multi-element standard sample (ICP-MES). The surface enhancement effect observed on Si3N4 coated substrates has improved the analytical capability of laser-induced breakdown spectroscopy for liquid analysis.en_US
dc.language.isoenen_US
dc.publisherElsevier Ltd.en_US
dc.relation.ispartofSpectrochimica Acta, Part B: Atomic Spectroscopyen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectLaser-induced breakdown spectroscopyen_US
dc.subjectDried-droplet analysisen_US
dc.subjectSilicon wafer based substrateen_US
dc.subjectAqueous metal solutionsen_US
dc.titleInvestigating silicon wafer based substrates for dried-droplet analysis by Laser-Induced Breakdown Spectroscopyen_US
dc.typeArticleen_US
dc.authoridSCOPUS:2-s2.0-85059318955-
dc.institutionauthorAras, Nadir-
dc.institutionauthorYalçın, Şerife-
dc.departmentIzmir Institute of Technology. Chemistryen_US
dc.identifier.volume152en_US
dc.identifier.startpage84en_US
dc.identifier.endpage92en_US
dc.identifier.wosWOS: 000460120200012-
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.identifier.doi10.1016/j.sab.2018.12.013-
dc.relation.doi10.1016/j.sab.2018.12.013en_US
dc.coverage.doi10.1016/j.sab.2018.12.013en_US
item.cerifentitytypePublications-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.openairetypeArticle-
item.grantfulltextopen-
item.languageiso639-1en-
item.fulltextWith Fulltext-
crisitem.author.deptDepartment of Chemistry-
Appears in Collections:Chemistry / Kimya
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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