Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/7854
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dc.contributor.authorYenigün, Onurtr
dc.contributor.authorBarışık, Murattr
dc.date.accessioned2020-07-18T03:35:17Z-
dc.date.available2020-07-18T03:35:17Z-
dc.date.issued2019-
dc.identifier.issn2369-8136-
dc.identifier.urihttps://doi.org/10.11159/htff19.152-
dc.identifier.urihttps://hdl.handle.net/11147/7854-
dc.description5th World Congress on Mechanical, Chemical, and Material Engineering, MCM 2019 -- 15 August 2019 through 17 August 2019en_US
dc.description.abstractIn this study, heat transfer rate of a nano-confined liquid is controlled by applying an electric field parallel to the heat transfer direction. Molecular Dynamics simulations are performed for deionized water confined between silicon slabs, where their surfaces oppositely charged to create an electric field perpendicular to the silicon wall to promote the electrowetting. Electric field strengths used in this study are 0, 0.18 and 0.35 V/nm. To investigate the effect of electric field on heat transfer, first water density profiles near the silicon walls are examined. Results shows that by applying electric field, water molecules near the silicon walls develop layering, which indicates the increased solid/liquid coupling. With the increasing electric field strength, an increase in the peak of the density layering is observed. Furthermore, heat transfer at the solid/liquid interface is characterized with the Kapitza length values. The results show that applying electric field reduces the interfacial thermal resistance between water and silicon due to the increased solid/liquid coupling and doubles the total heat flux. © 2019, Avestia Publishing.en_US
dc.language.isoenen_US
dc.publisherAvestia Publishingen_US
dc.relation.ispartofProceedings of the World Congress on Mechanical, Chemical, and Material Engineeringen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectElectrowettingen_US
dc.subjectInterfacial thermal resistanceen_US
dc.subjectKapitza lengthen_US
dc.subjectMoLecular dynamicsen_US
dc.titleEffect of electric field on interfacial thermal resistance between silicon and water at nanoscalesen_US
dc.typeConference Objecten_US
dc.institutionauthorYenigün, Onurtr
dc.institutionauthorBarışık, Murattr
dc.departmentİzmir Institute of Technology. Mechanical Engineeringen_US
dc.identifier.scopus2-s2.0-85082666953en_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıtr
dc.identifier.doi10.11159/htff19.152-
dc.relation.doi10.11159/htff19.152en_US
dc.coverage.doi10.11159/htff19.152en_US
dc.identifier.wosqualityN/A-
dc.identifier.scopusqualityQ4-
item.fulltextWith Fulltext-
item.grantfulltextopen-
item.languageiso639-1en-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
item.openairetypeConference Object-
crisitem.author.dept03.10. Department of Mechanical Engineering-
Appears in Collections:Mechanical Engineering / Makina Mühendisliği
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
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