Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/5961
Title: High-speed dynamic atomic force microscopy by using a Q-controlled cantilever eigenmode as an actuator
Authors: Balantekin, Müjdat
Balantekin, Müjdat
Izmir Institute of Technology. Electronics and Communication Engineering
Keywords: Atomic Force Microscope
Fast actuation
High-speed dynamic AFM
Q-controlled eigenmode of a cantilever
Imaging speed
Issue Date: 1-Feb-2015
Publisher: Elsevier Ltd.
Source: Balantekin, M. (2015). High-speed dynamic atomic force microscopy by using a Q-controlled cantilever eigenmode as an actuator. Ultramicroscopy, 149, 45-50. doi:10.1016/j.ultramic.2014.11.016
Abstract: We present a high-speed operating method with feedback to be used in dynamic atomic force microscope (AFM) systems. In this method we do not use an actuator that has to be employed to move the tip or the sample as in conventional AFM setups. Instead, we utilize a Q-controlled eigenmode of an AFM cantilever to perform the function of the actuator. Simulations show that even with an ordinary tapping-mode cantilever, imaging speed can be increased by about 2 orders of magnitude compared to conventional dynamic AFM imaging.
URI: https://doi.org/10.1016/j.ultramic.2014.11.016
http://hdl.handle.net/11147/5961
ISSN: 0304-3991
Appears in Collections:Electrical - Electronic Engineering / Elektrik - Elektronik Mühendisliği
PubMed İndeksli Yayınlar Koleksiyonu / PubMed Indexed Publications Collection
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection

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