Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/5429
Title: Determination of electrostatic potential distribution by atomic force microscopy (AFM) on model silica and alumina surfaces in aqueous electrolyte solutions
Authors: Yelken Özek, Gülnihal
Polat, Mehmet
Yelken Özek, Gülnihal
Polat, Mehmet
Izmir Institute of Technology. Chemical Engineering
Keywords: Atomic force microscopy
DLVO theory
Force curve
Surface potential map
Electrostatics
Issue Date: May-2014
Publisher: Elsevier Ltd.
Source: Yelken Özek, G., and Polat, M. (2014). Determination of electrostatic potential distribution by atomic force microscopy (AFM) on model silica and alumina surfaces in aqueous electrolyte solutions. Applied Surface Science, 301, 149-155. doi:10.1016/j.apsusc.2014.02.022
Abstract: AFM was employed as a physicochemical probe to determine the electrostatic potential distribution quantitatively on selected ideal oxide surfaces (quartz 0 0 0 1 and sapphire 0 0 0 1) in aqueous media. The force of interaction between a silicon nitride tip and the oxide surface was measured at a given point under well-defined solution conditions. Relevant theories were used to isolate the electrostatic component from the total force of interaction which was then employed to estimate the surface potential at that point. Repeating the procedure on selected locations generated a potential map of the surface. Comparison of these potentials with those obtained from independent electrokinetic measurements confirmed the validity of the approach. © 2014 Elsevier B.V. All rights reserved.
URI: http://doi.org/10.1016/j.apsusc.2014.02.022
http://hdl.handle.net/11147/5429
ISSN: 0169-4332
0169-4332
1873-5584
Appears in Collections:Chemical Engineering / Kimya Mühendisliği
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection

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