Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/2564
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dc.contributor.authorAyav, Tolga-
dc.date.accessioned2016-12-01T13:43:46Z-
dc.date.available2016-12-01T13:43:46Z-
dc.date.issued2015-06-22-
dc.identifier.citationAyav, T. (2015, May 16-19). Birleşimsel devreler için otomatik test örüntüsü oluşturma. Paper presented at the 23rd Signal Processing and Communications Applications Conference. doi:10.1109/SIU.2015.7129939en_US
dc.identifier.isbn9781467373869-
dc.identifier.urihttp://doi.org/10.1109/SIU.2015.7129939-
dc.identifier.urihttp://hdl.handle.net/11147/2564-
dc.description23rd Signal Processing and Communications Applications Conference, SIU 2015; Inonu UniversitesiMalatya; Turkey; 16 May 2015 through 19 May 2015en_US
dc.description.abstractBoole işlevlerinin Fourier analizi son on yılda bilgisayar bilimlerinde oldukça ilgi çeken bir konu olmasına ragmen henüz çok az uygulama alanı bulabilmiştir. Bu çalışma birleşimsel mantık devrelerinin testi için Fourier analizi tabanlı bir otomatik test örüntüsü oluşturma metodu sunmaktadır.en_US
dc.description.abstractFourier analysis of boolean functions has attracted great attention from computer scientists in the last decade but it still has few application areas. This work presents a Fourier analysis-based automatic test pattern generation method for combinational circuits.en_US
dc.language.isotren_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.relation.ispartof23rd Signal Processing and Communications Applications Conference, SIU 2015en_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectBirleşimsel devreen_US
dc.subjectFourier analizien_US
dc.subjectOtomatik test örüntüsü oluşturmaen_US
dc.subjectAutomatic test pattern generationen_US
dc.subjectCombinational circuiten_US
dc.subjectFourier analysisen_US
dc.subjectWalsh transformationen_US
dc.titleBirleşimsel devreler için otomatik test örüntüsü oluşturmaen_US
dc.title.alternativeFourier analysis-based automatic test pattern generation for combinational circuitsen_US
dc.typeConference Objecten_US
dc.authoridTR114453en_US
dc.institutionauthorAyav, Tolga-
dc.departmentIzmir Institute of Technology. Computer Engineeringen_US
dc.identifier.startpage128en_US
dc.identifier.endpage131en_US
dc.identifier.scopus2-s2.0-84939130297en_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.identifier.doi10.1109/SIU.2015.7129939-
item.openairetypeConference Object-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.fulltextWith Fulltext-
item.cerifentitytypePublications-
item.languageiso639-1tr-
item.grantfulltextopen-
crisitem.author.dept03.04. Department of Computer Engineering-
Appears in Collections:Computer Engineering / Bilgisayar Mühendisliği
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
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