Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/14143
Title: Automatic Test Sequence Generation and Functional Coverage Measurement From Uml Sequence Diagrams
Authors: Ekici, Nazim Umut
Tuglular, Tugkan
Keywords: Acceptance Testing
Event Sequence Diagram
Functional Coverage
Sequence Diagram
Test Case Generation
Publisher: Igi Global
Abstract: Sequence diagrams define functional requirements through use cases. However, their visual form limits their usability in the later stages of the development life cycle. This work proposes a method to transform sequence diagrams into graph-based event sequence graphs, allowing the application of graph analysis methods and defining graph-based coverage criteria. This work explores these newfound abilities in two directions. The first is to use coverage criteria along with existing tests to measure their coverage levels, providing a metric of how well they address the scenarios defined in sequence diagrams. The second is to use coverage criteria to automatically generate effective and efficient acceptance test cases based on the scenarios defined in sequence diagrams. The transformation method is validated with over eighty non-trivial projects. The complete method is validated through a non-trivial example. The results show that the test cases generated with the proposed method are more effective at exposing faults and more efficient in test input size than user-generated test cases.
Description: Tuglular, Tugkan/0000-0001-6797-3913
URI: https://doi.org/10.4018/IJISMD.332865
ISSN: 1947-8186
1947-8194
Appears in Collections:Computer Engineering / Bilgisayar Mühendisliği
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection

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