Issue Date | Title | Author(s) |
2021 | Behavior of Al4C3 particles during flotation and sedimentation in aluminum melts | Gökelma, Mertol ; Storm Aarnaes, Trygve; Maier, Juergen; Renkel, Maria F.; Ekstrom, Kai Erik; Friedrich, Bernd; Tranell, Gabriella |
Jul-2017 | Comparative study of annealing and gold dopant effect on DC sputtered vanadium oxide films for bolometer applications | Alaboz, Hakan; Demirhan, Yasemin ; Yüce, Hürriyet ; Aygün, Gülnur ; Özyüzer, Lütfi |
2017 | Determination of aluminum oxide thickness on the annealed surface of 8000 series aluminum foil by fourier transform infrared spectroscopy | İnanç Uçar, Özlem; Ekin Meşe, Ayten; Birbaşar, Onur; Dündar, Murat; Özdemir, Durmuş |
28-Nov-2008 | Electrical and dielectrical properties of tantalum oxide films grown by Nd:YAG laser assisted oxidation | Aygün, Gülnur ; Turan, Raşit |
Nov-2014 | Impact of incorporated oxygen quantity on optical, structural and dielectric properties of reactive magnetron sputter grown high-? HfO2/Hf/Si thin film | Cantaş, Ayten; Aygün, Gülnur ; Turan, Raşit |
Nov-2018 | Study of undoped and indium doped ZnO thin films deposited by sol gel method | Medjaldi, M.; Touil, O.; Boudine, B.; Zaabat, M.; Halimi, O.; Sebais, M.; Özyüzer, Lütfi |
2023 | Weak Dependence of Voltage Amplification in a Semiconductor Channel on Strain State and Thickness of a Multidomain Ferroelectric in a Bilayer Gate | Misirlioglu, I.B.; Yapici, M.K.; Sendur, K.; Okatan, M.B. |