Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/9820
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dc.contributor.authorDoğan, Tunca-
dc.contributor.authorKaraçalı, Bilge-
dc.date.accessioned2021-01-24T18:28:39Z-
dc.date.available2021-01-24T18:28:39Z-
dc.date.issued2010-
dc.identifier.isbn978-142446382-4-
dc.identifier.urihttps://doi.org/10.1109/BIYOMUT.2010.5479846-
dc.identifier.urihttps://hdl.handle.net/11147/9820-
dc.description.abstractWe present an error analysis on the application of non-linear embedding on pairwise evolutionary distances inferred over a collection of genetic sequences following multiple sequence alignment. To this end, we have generated gene sequences evolved by random substitutions along three different evolutionary pathways with known evolutionary distances between every sequence pair. We have compared the discrepancy between the inferred evolutionary distances to the true distances before and after non-linear embedding into a low dimensional vector space. The results indicate that non-linear embedding achieves significant reduction in error in the estimated evolutionary distances. Consequently, nonlinear embedding of evolutionary distances can provide more reliable inferences on the evolutionary relationships between genetic sequences. ©2010 IEEE.en_US
dc.language.isotren_US
dc.publisherIEEEen_US
dc.relation.ispartof2010 15th National Biomedical Engineering Meeting, BIYOMUT2010en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.titleDoğrusal olmayan gömme teknikleri altında gen dizilerinin evrimsel i̇lişkilerien_US
dc.title.alternativeEvolutionary relationships between gene sequences via nonlinear embedding-
dc.typeConference Objecten_US
dc.institutionauthorDoğan, Tunca-
dc.institutionauthorKaraçalı, Bilge-
dc.departmentİzmir Institute of Technology. Electrical and Electronics Engineeringen_US
dc.identifier.scopus2-s2.0-77954428330en_US
dc.relation.publicationcategoryKonferans Öğesi - Ulusal - Kurum Öğretim Elemanıen_US
dc.identifier.doi10.1109/BIYOMUT.2010.5479846-
dc.relation.doi10.1109/BIYOMUT.2010.5479846en_US
dc.coverage.doi10.1109/BIYOMUT.2010.5479846en_US
dc.identifier.wosqualityN/A-
dc.identifier.scopusqualityN/A-
item.fulltextWith Fulltext-
item.grantfulltextopen-
item.languageiso639-1tr-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
item.openairetypeConference Object-
crisitem.author.dept03.05. Department of Electrical and Electronics Engineering-
Appears in Collections:Electrical - Electronic Engineering / Elektrik - Elektronik Mühendisliği
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
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