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|Title:||Efficient representation of measured BRDF data using Lafortune model||Authors:||Ozan, Şükrü
|Issue Date:||2010||Publisher:||Institute of Electrical and Electronics Engineers Inc.||Abstract:||The bi-directional reflectance distribution function (BRDF) describes the appearance of a material by its interaction with light. In this study, Lafortune BRDF model is fitted to densely sampled measured BRDF data by using Levenberg - Marquardt Algorithm. The obtained results are visualised by a physically based ray tracing software and the proposed method is analysed. ©2010 IEEE.||URI:||https://doi.org/10.1109/SIU.2010.5650225
|Appears in Collections:||Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection|
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