Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/9397
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dc.contributor.authorChah, K.-
dc.contributor.authorKinet, D.-
dc.contributor.authorYüksel, Kıvılcım-
dc.contributor.authorCaucheteur, C.-
dc.date.accessioned2020-07-25T22:10:45Z-
dc.date.available2020-07-25T22:10:45Z-
dc.date.issued2019-
dc.identifier.isbn978-1-5106-3124-3-
dc.identifier.issn0277-786X-
dc.identifier.issn1996-756X-
dc.identifier.urihttps://doi.org/10.1117/12.2541130-
dc.identifier.urihttps://hdl.handle.net/11147/9397-
dc.description7th European Workshop on Optical Fibre Sensors (EWOFS) -- OCT 01-04, 2019 -- Limassol, CYPRUSen_US
dc.description.abstractThis paper shows that fiber Bragg gratings written in standard single mode optical fiber with IR femtosecond pulses and point-by-point technique are high temperature resistant (< 1000 degrees C). Moreover, after calibration process, these gratings can be used as a reference to study and discriminate between different high temperature annealing mechanisms involved in other types of gratings and/or fibers. Here we have considered the regeneration process of gratings written by UV laser in boron/germanium co-doped single mode optical fiber. Hence, the monitoring of grating strength and differential wavelength shift between femtosecond and type-I gratings during annealing cycle yields the wavelength shift due to the annealing of doping (mainly boron) and UV-related defects and their relative contributions to the regeneration mechanism.en_US
dc.language.isoenen_US
dc.publisherSPIEen_US
dc.relation.ispartofProceedings of SPIE - The International Society for Optical Engineeringen_US
dc.relation.ispartofseriesProceedings of SPIE-
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectFemtosecond FBGen_US
dc.subjectHigh temperatureen_US
dc.subjectAnnealingen_US
dc.subjectRegenerationen_US
dc.titleFs FBGs as probes to monitor thermal regeneration mechanismsen_US
dc.typeConference Objecten_US
dc.institutionauthorYüksel, Kıvılcım-
dc.departmentİzmir Institute of Technology. Electrical and Electronics Engineeringen_US
dc.identifier.volume11199en_US
dc.identifier.wosWOS:000511108100113en_US
dc.identifier.scopus2-s2.0-85073359256en_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.identifier.doi10.1117/12.2541130-
dc.relation.doi10.1117/12.2541130en_US
dc.coverage.doi10.1117/12.2541130en_US
dc.identifier.wosqualityN/A-
dc.identifier.scopusqualityQ4-
item.fulltextNo Fulltext-
item.grantfulltextnone-
item.languageiso639-1en-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
item.openairetypeConference Object-
crisitem.author.dept03.05. Department of Electrical and Electronics Engineering-
Appears in Collections:Electrical - Electronic Engineering / Elektrik - Elektronik Mühendisliği
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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