Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/4925
Title: Terahertz wave emission from layered superconductors: Interferometer measurements
Authors: Özyüzer, Lütfi
Türkoğlu, Fulya
Demirhan, Yasemin
Köseoğlu, Hasan
Preu, S.
Ploss, D.
Malzer, S.
Şimşek, Yılmaz
Wang, Huabing
Müller, P.
Özyüzer, Lütfi
Türkoğlu, Fulya
Demirhan, Yasemin
Köseoğlu, Hasan
Izmir Institute of Technology. Physics
Keywords: Current voltage characteristics
Terahertz (THz) waves
Interferometers
Superconducting materials
Issue Date: 2011
Publisher: Institute of Electrical and Electronics Engineers Inc.
Source: Özyüzer, L., Türkoğlu, F., Demirhan, Y., Köseoğlu, H., Preu, S., Ploss, D., Malzer, S., Şimşek, Y., Wang, H., and Müller, P. (2011, August 13-20). Terahertz wave emission from layered superconductors: Interferometer measurements. Paper presented at the 30th URSI General Assembly and Scientific Symposium. doi:10.1109/URSIGASS.2011.6050610
Abstract: Rectangular Bi2Sr2CaCu2O 8+δ (Bi2212) mesa structures were fabricated on as-grown Bi2212 single crystal superconductors using standard photolithography and Ar ion beam etching techniques. We have performed c-axis resistance versus temperature (R-T), current-voltage (I-V) characteristics and bolometer measurements. Furthermore, in contrast to previous studies, the emission frequency was determined using interferometer set up instead of FTIR. The interference patterns were detected outside the cryostat after traveling long way through ambient space. The emission frequency calculated by Fourier transform of interference data is consistent with Josephson frequency-voltage relation. © 2011 IEEE.
Description: 30th URSI General Assembly and Scientific Symposium, URSIGASS 2011; Istanbul; Turkey; 13 August 2011 through 20 August 201
URI: http://doi.org/10.1109/URSIGASS.2011.6050610
http://hdl.handle.net/11147/4925
ISBN: 9781424451173
Appears in Collections:Physics / Fizik
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection

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