Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/4671
Full metadata record
DC FieldValueLanguage
dc.contributor.authorGüneş, Mehmet-
dc.contributor.authorAkdaş, Deniz-
dc.contributor.authorGöktaş, Oktay-
dc.contributor.authorCarius, Reinhard-
dc.contributor.authorKlomfaß, Josef-
dc.contributor.authorFinger, Friedhelm-
dc.date.accessioned2016-05-27T11:02:29Z
dc.date.available2016-05-27T11:02:29Z
dc.date.issued2003-10
dc.identifier.citationGüneş, M., Akdaş, D., Göktaş, O., Carius, R., Klomfaß, J., and Finger, F. (2003). Photoconductivity spectroscopy in hydrogenated microcrystalline silicon thin films. Journal of Materials Science: Materials in Electronics, 14(10-12), 729-730. doi:10.1023/A:1026147624811en_US
dc.identifier.issn0957-4522
dc.identifier.issn0957-4522-
dc.identifier.urihttp://doi.org/10.1023/A:1026147624811
dc.identifier.urihttp://hdl.handle.net/11147/4671
dc.description.abstractSteady-state photoconductivity and sub-bandgap absorption measurements by the dual-beam photoconductivity (DBF) method were carried out on undoped hydrogenated microcrystalline silicon thin films prepared by VHF-PECVD and hot-wire chemical vapor deposition. The results are compared with those of the constant-photocurrent method (CPM) and photothermal deflection spectroscopy (PDS). It is found that DBP, CPM, and PDS provide complementary data on the optoelectronic processes in microcrystalline silicon.en_US
dc.description.sponsorshipTÜBİTAKen_US
dc.language.isoenen_US
dc.publisherSpringer Verlagen_US
dc.relation.ispartofJournal of Materials Science: Materials in Electronicsen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectThin filmsen_US
dc.subjectPhotothermal deflection spectroscopy (PDS)en_US
dc.subjectChemical vapor depositionen_US
dc.subjectCrystalline materialsen_US
dc.subjectHydrogenationen_US
dc.titlePhotoconductivity spectroscopy in hydrogenated microcrystalline silicon thin filmsen_US
dc.typeConference Objecten_US
dc.authoridTR1299en_US
dc.institutionauthorGüneş, Mehmet-
dc.institutionauthorAkdaş, Deniz-
dc.institutionauthorGöktaş, Oktay-
dc.departmentIzmir Institute of Technology. Physicsen_US
dc.identifier.volume14en_US
dc.identifier.issue10-12en_US
dc.identifier.startpage729en_US
dc.identifier.endpage730en_US
dc.identifier.wosWOS:000185962400030
dc.identifier.scopusSCOPUS:2-s2.0-0242348718
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.identifier.doi10.1023/A:1026147624811-
dc.relation.doi10.1023/A:1026147624811en_US
dc.coverage.doi10.1023/A:1026147624811en_US
item.cerifentitytypePublications-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.openairetypeConference Object-
item.grantfulltextopen-
item.languageiso639-1en-
item.fulltextWith Fulltext-
Appears in Collections:Physics / Fizik
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
Files in This Item:
File Description SizeFormat 
4671.pdfConference Paper219.13 kBAdobe PDFThumbnail
View/Open
Show simple item record

CORE Recommender

SCOPUSTM   
Citations

4
checked on Dec 4, 2021

WEB OF SCIENCETM
Citations

4
checked on Dec 4, 2021

Page view(s)

14
checked on Dec 6, 2021

Download(s)

16
checked on Dec 6, 2021

Google ScholarTM

Check

Altmetric


Items in GCRIS Repository are protected by copyright, with all rights reserved, unless otherwise indicated.