Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/2817
Title: Analysis of electronic parameters and interface states of boron dispersed triethanolamine/p-Si structure by AFM, I-V, C-V-f and G/?-V-f techniques
Authors: Yakuphanoğlu, Fahrettin
Okur, Salih
Okur, Salih
Keywords: Crystal atomic structure
Boron
Interfacial state density
Metal/semiconductor contacts
Issue Date: Jan-2010
Publisher: Elsevier Ltd.
Source: Yakuphanoğlu, F., and Okur, S. (2010). Analysis of electronic parameters and interface states of boron dispersed triethanolamine/p-Si structure by AFM, I-V, C-V-f and G/ω-V-f techniques. Microelectronic Engineering, 87(1), 30-34. doi:10.1016/j.mee.2009.05.012
Abstract: The electronic parameters and interface state properties of boron dispersed triethanolamine/p-Si structure have been investigated by atomic force microscopy, I-V, C-V-f and G/ω-V-f techniques. The surface topography and phase image of the TEA-B film deposited onto p-Si substrate were analyzed by atomic force microscopy. The atomic force microscopy results show a homogenous distribution of boron particles in triethanolamine film. The electronic parameters (barrier height, ideality factor and average series resistance) obtained from I-V characteristics of the diode are 0.81 eV, 2.07 and 5.04 kΩ, respectively. The interface state density of the diode was found to be 2.54 × 1010 eV- cm-2 under Vg = 0. The obtained Dit values obtained from C-V and G/ω measurements are in agreement with each other. The profile of series resistance dependent on voltage and frequency confirms the presence of interface states in boron dispersed triethanolamine/p-Si structure. It is evaluated that the boron dispersed triethanolamine controls the electronic parameters and interface properties of conventional Al/p-Si diode. © 2009 Elsevier B.V. All rights reserved.
URI: http://doi.org/10.1016/j.mee.2009.05.012
http://hdl.handle.net/11147/2817
ISSN: 0167-9317
Appears in Collections:Physics / Fizik
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection

Files in This Item:
File Description SizeFormat 
2817.pdfMakale1.86 MBAdobe PDFThumbnail
View/Open
Show full item record

CORE Recommender

SCOPUSTM   
Citations

38
checked on Oct 23, 2021

WEB OF SCIENCETM
Citations

42
checked on Oct 23, 2021

Page view(s)

24
checked on Oct 25, 2021

Download(s)

30
checked on Oct 25, 2021

Google ScholarTM

Check

Altmetric


Items in GCRIS Repository are protected by copyright, with all rights reserved, unless otherwise indicated.