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https://hdl.handle.net/11147/2602
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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yüksel, Kıvılcım | - |
dc.contributor.author | Wuilpart, Marc | - |
dc.contributor.author | Moeyaert, Véronique | - |
dc.contributor.author | Mégret, Patrice | - |
dc.date.accessioned | 2016-12-12T10:54:50Z | - |
dc.date.available | 2016-12-12T10:54:50Z | - |
dc.date.issued | 2009 | - |
dc.identifier.citation | Yüksel, K., Wuilpart, M., Moeyaert, V., and Mégret, P. (2009). Optical Frequency Domain Reflectometry: A review. Paper presented at the 11th International Conference on Transparent Optical Networks. doi:10.1109/ICTON.2009.5185111 | en_US |
dc.identifier.isbn | 9781424448265 | - |
dc.identifier.uri | http://doi.org/10.1109/ICTON.2009.5185111 | - |
dc.identifier.uri | http://hdl.handle.net/11147/2602 | - |
dc.description | ICTON 2009: 11th International Conference on Transparent Optical Networks; Ponta Delgada; Portugal; 28 June 2009 through 2 July 2009 | en_US |
dc.description.abstract | In this paper, we discuss the operation principles, challenges and application areas of optical frequency domain reflectometry technique. A review of OFDR systems is given considering both Incoherent-OFDR and Coherent- OFDR groups. Results obtained by different research groups are compared in terms of performance characteristics, and future perspectives. Recent progresses obtained within our laboratory are also presented. ©2009 IEEE. | en_US |
dc.description.sponsorship | Fonds de la Recherche Scientifique-Crédit aux Chercheurs | en_US |
dc.language.iso | en | en_US |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | en_US |
dc.relation.ispartof | ICTON 2009: 11th International Conference on Transparent Optical Networks | en_US |
dc.rights | info:eu-repo/semantics/openAccess | en_US |
dc.subject | Transparent optical networks | en_US |
dc.subject | Nonlinear optical frequency sweep | en_US |
dc.subject | OFDR system | en_US |
dc.subject | Optical frequency domain reflectometer | en_US |
dc.title | Optical Frequency Domain Reflectometry: a Review | en_US |
dc.type | Conference Object | en_US |
dc.authorid | TR119564 | - |
dc.institutionauthor | Yüksel, Kıvılcım | - |
dc.department | İzmir Institute of Technology. Electrical and Electronics Engineering | en_US |
dc.identifier.wos | WOS:000274048000186 | - |
dc.relation.publicationcategory | Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı | en_US |
dc.identifier.doi | 10.1109/ICTON.2009.5185111 | - |
dc.relation.doi | 10.1109/ICTON.2009.5185111 | en_US |
dc.coverage.doi | 10.1109/ICTON.2009.5185111 | - |
dc.identifier.wosquality | N/A | - |
dc.identifier.scopusquality | N/A | - |
item.openairecristype | http://purl.org/coar/resource_type/c_18cf | - |
item.languageiso639-1 | en | - |
item.openairetype | Conference Object | - |
item.grantfulltext | open | - |
item.fulltext | With Fulltext | - |
item.cerifentitytype | Publications | - |
crisitem.author.dept | 03.05. Department of Electrical and Electronics Engineering | - |
Appears in Collections: | Electrical - Electronic Engineering / Elektrik - Elektronik Mühendisliği Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection |
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