Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/2221
Title: Sub-bandgap optical absorption spectroscopy of hydrogenated microcrystalline silicon thin films prepared using hot-wire CVD (Cat-CVD) process
Authors: Göktaş, Oktay
Işık, Nebile
Okur, Salih
Güneş, Mehmet
Carius, Reinhard
Klomfaß, Josef
Finger, Friedhelm
Göktaş, Oktay
Işık, Nebile
Okur, Salih
Güneş, Mehmet
Izmir Institute of Technology. Physics
Keywords: Crystalline materials
Electrical properties and measurements
Hot-wire deposition
Microcrystalline silicon thin films
Thin films
Issue Date: Apr-2006
Publisher: Elsevier Ltd.
Source: Göktaş, O., Işık, N., Okur, S., Güneş, M., Carius, R., Klomfaß, J., and Finger, F.(2006). Sub-bandgap optical absorption spectroscopy of hydrogenated microcrystalline silicon thin films prepared using hot-wire CVD (Cat-CVD) process. Thin Solid Films, 501(1-2), 121-124. doi:10.1016/j.tsf.2005.07.137
Abstract: Hydrogenated microcrystalline silicon (μc-Si:H) thin films with different silane concentration (SC) have been prepared using the HW-CVD technique. Dual beam photoconductivity (DBP), photothermal deflection spectroscopy (PDS), and transmission measurements have been used to investigate the optical properties of the μc-Si:H films. Two different sub-bandgap absorption, α(hν), methods have been applied and analyzed to obtain a better insight into the electronic states involved. A good agreement has been obtained in the absorption spectrum obtained from the PDS and DBP measurements at energies above the bandgap. Differences between PDS and DBP spectra exist below the bandgap energy where DBP spectra always give lower α(hν) values and show a dependence on the SC. For some films, differences exist in the α(hν) spectra when the DBP measurements are carried out through the film and substrate side. In addition, for some films, there remains fringe pattern left on the spectrum after the calculation of the fringe-free absorption spectrum, which indicates structural inhomogeneities present throughout the film.
Description: Proceedings of the Third International Conference on Hot-Wire; 23 August 2004 through 27 August 2004
URI: http://doi.org/10.1016/j.tsf.2005.07.137
http://hdl.handle.net/11147/2221
ISSN: 0040-6090
0040-6090
Appears in Collections:Physics / Fizik
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection

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