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dc.contributor.authorOkur, Salih
dc.contributor.authorKalkancı, M.
dc.contributor.authorYavaş, Mert
dc.contributor.authorEğilmez, Mehmet
dc.contributor.authorÖzyüzer, Lütfi
dc.date.accessioned2016-08-02T08:18:38Z
dc.date.available2016-08-02T08:18:38Z
dc.date.issued2005-02
dc.identifier.citationOkur, S., Kalkancı, M., Yavaş, M., Eğilmez, M., and Özyüzer, L. (2005). Microstructural and electrical characterization of Ti and Mg doped Cu-clad MgB2 superconducting wires. Journal of Optoelectronics and Advanced Materials, 7(1), 411-414.en_US
dc.identifier.issn1454-4164
dc.identifier.urihttp://hdl.handle.net/11147/2030
dc.description.abstractThe recent studies on Ti doping effect on the critical current density (Jc) of MgB2 composite superconductors prepared under ambient pressure has shown an important enhancement at 20 K. In the present work, we have fabricated Ti and Mg doped superconducting MgB2 wires by packing reacted MgB2 and Ti or Mg powders together inside Cu tubes with a diameter of 6 mm. The tubes were then cold worked by rolling or drawing to smaller diameters. The prepared Cu-clad Ti and Mg added MgB 2 superconducting wires were annealed at various temperatures to enhance the grain connectivity of the MgB2 bulk materials. The effect of the sintering time has been investigated for high performance characteristics of superconducting Cu-clad Ti and Mg added MgB2 wires. The microstructural evaluation of the superconducting wires has been carried out using XRD and SEM equipped with EDX analysis system. The interfacial properties between Cu sheath and superconducting core was characterized using SEM-EDX. Furthermore, the influence of the presence of Ti and Mg on Tc has been investigated to understand the structural and electronic properties of superconducting Ti and Mg doped MgB2 wires.en_US
dc.language.isoengen_US
dc.publisherNational Institute of Optoelectronicsen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectPowder in tube methoden_US
dc.subjectSuperconducting wireen_US
dc.subjectCritical current densitiesen_US
dc.subjectFlux pinning centersen_US
dc.titleMicrostructural and electrical characterization of Ti and Mg doped Cu-clad MgB2 superconducting wiresen_US
dc.typeconferenceObjecten_US
dc.contributor.authorIDTR12208en_US
dc.contributor.authorIDTR5135en_US
dc.contributor.institutionauthorOkur, Salih
dc.contributor.institutionauthorKalkancı, M.
dc.contributor.institutionauthorYavaş, Mert
dc.contributor.institutionauthorEğilmez, Mehmet
dc.contributor.institutionauthorÖzyüzer, Lütfi
dc.relation.journalJournal of Optoelectronics and Advanced Materialsen_US
dc.contributor.departmentIzmir Institute of Technology. Physicsen_US
dc.identifier.volume7en_US
dc.identifier.issue1en_US
dc.identifier.startpage411en_US
dc.identifier.endpage414en_US
dc.identifier.wosWOS:000228522700073
dc.identifier.scopusSCOPUS:2-s2.0-15244354804
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US


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