Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/14595
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dc.contributor.authorDiker, Halide-
dc.contributor.authorOzguler, Sahika-
dc.contributor.authorUnluturk, Secil Sevim-
dc.contributor.authorOzcelik, Serdar-
dc.contributor.authorVarlikli, Canan-
dc.date.accessioned2024-06-19T14:29:46Z-
dc.date.available2024-06-19T14:29:46Z-
dc.date.issued2024-
dc.identifier.issn2365-6549-
dc.identifier.urihttps://doi.org/10.1002/slct.202401851-
dc.descriptionSEVIM UNLUTURK, Secil/0000-0001-8300-3837en_US
dc.description.abstractBlue light-emitting CdSe@ZnS/ZnS quantum dot (QD) nanoparticles (NPs) were synthesized and their photophysical properties in both solution and film phases were investigated. The morphological properties of films prepared by different coating methods i. e. single layer coating from low to high concentrations of QD solutions and layer-by-layer (multilayer) coating within constant low QD solution concentration, were also examined in detail. Varying the concentration (1-10 mg/mL) and the number of layers (from 1-16) did not essentially affect the photophysical properties of QD films, although it resulted in a direct increment in QD film thickness. The concentration and layer-dependent films were used as an emissive layer (EML) in QD light-emitting diodes (QLEDs). Although the "6 mg/ml(-1) Layer" QD EML-based device exhibited relatively high device efficiency compared to the "1 mg/ml(-10) Layers" based one at working voltage region, it had similar to 2-fold higher efficiency roll-off at high voltage region. The performance differences for both devices with the same QD EML thickness were attributed to the morphological variations for the QD layer in terms of surface roughness, void density, aggregates/clusters, and trap sites that were directly related to the charge injection balance and Auger recombination.en_US
dc.description.sponsorshipScientific and Technological Research Council of Tuerkiye (TUBITAK) [115F616]en_US
dc.description.sponsorshipWe acknowledge project support from the Scientific and Technological Research Council of Tuerkiye (TUBITAK) (Project no. 115F616) and thank the Izmir Institute of Technology, The Centre for Materials Research for AFM measurements.en_US
dc.language.isoenen_US
dc.publisherWiley-v C H verlag Gmbhen_US
dc.relation.ispartofChemistrySelecten_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectCdSe@ZnS/ZnS QDsen_US
dc.subjectblue QLEDen_US
dc.subjectlayer-by-layer coating methoden_US
dc.subjectefficiency roll-offen_US
dc.titleImproving the Device Stability by Controlling the Morphology of Quantum Dot Emissive Layer Via a Coating Process in Blue QLEDsen_US
dc.typeArticleen_US
dc.authoridSEVIM UNLUTURK, Secil/0000-0001-8300-3837-
dc.departmentIzmir Institute of Technologyen_US
dc.identifier.volume9en_US
dc.identifier.issue22en_US
dc.identifier.wosWOS:001249299100009-
dc.identifier.scopus2-s2.0-85195538227-
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.identifier.doi10.1002/slct.202401851-
dc.authorscopusid36699576500-
dc.authorscopusid57218477157-
dc.authorscopusid57270266600-
dc.authorscopusid7004257791-
dc.authorscopusid16053852700-
dc.authorwosidDiker, Halide/ABF-2840-2021-
dc.authorwosidSEVIM UNLUTURK, Secil/Y-1210-2018-
dc.identifier.wosqualityQ3-
dc.identifier.scopusqualityQ3-
dc.description.woscitationindexScience Citation Index Expanded-
item.fulltextNo Fulltext-
item.grantfulltextnone-
item.languageiso639-1en-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
item.openairetypeArticle-
crisitem.author.dept01. Izmir Institute of Technology-
crisitem.author.dept04.01. Department of Chemistry-
crisitem.author.dept04.04. Department of Photonics-
Appears in Collections:Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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