Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/14191
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dc.contributor.authorKilincceker, O.-
dc.contributor.authorTurk, E.-
dc.contributor.authorBelli, F.-
dc.contributor.authorChallenger, M.-
dc.date.accessioned2024-01-06T07:22:34Z-
dc.date.available2024-01-06T07:22:34Z-
dc.date.issued2022-
dc.identifier.issn1619-1366-
dc.identifier.urihttps://doi.org/10.1007/s10270-021-00934-6-
dc.identifier.urihttps://hdl.handle.net/11147/14191-
dc.description.abstractAn ideal test is supposed to show not only the presence of bugs but also their absence. Based on the Fundamental Test Theory of Goodenough and Gerhart (IEEE Trans Softw Eng SE-1(2):156–173, 1975), this paper proposes an approach to model-based ideal testing of hardware description language (HDL) programs based on their behavioral model. Test sequences are generated from both original (fault-free) and mutant (faulty) models in the sense of positive and negative testing, forming a holistic test view. These test sequences are then executed on original (fault-free) and mutant (faulty) HDL programs, in the sense of mutation testing. Using the techniques known from automata theory, test selection criteria are developed and formally show that they fulfill the major requirements of Fundamental Test Theory, that is, reliability and validity. The current paper comprises a preparation step (consisting of the sub-steps model construction, model mutation, model conversion, and test generation) and a composition step (consisting of the sub-steps pre-selection and construction of Ideal test suites). All the steps are supported by a toolchain that is already implemented and is available online. To critically validate the proposed approach, three case studies (a sequence detector, a traffic light controller, and a RISC-V processor) are used and the strengths and weaknesses of the approach are discussed. The proposed approach achieves the highest mutation score in positive and negative testing for all case studies in comparison with two existing methods (regular expression-based test generation and context-based random test generation), using four different techniques. © 2021, The Author(s), under exclusive licence to Springer-Verlag GmbH Germany, part of Springer Nature.en_US
dc.description.sponsorship43169en_US
dc.language.isoenen_US
dc.publisherSpringer Science and Business Media Deutschland GmbHen_US
dc.relation.ispartofSoftware and Systems Modelingen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectBehavioral modelen_US
dc.subjectHardware description languageen_US
dc.subjectIdeal testingen_US
dc.subjectModel-based testingen_US
dc.subjectMutation testingen_US
dc.subjectBehavioral researchen_US
dc.subjectComputer hardware description languagesen_US
dc.subjectModel checkingen_US
dc.subjectPattern matchingen_US
dc.subjectReliability theoryen_US
dc.subjectTestingen_US
dc.subjectBehavioral modelen_US
dc.subjectCase-studiesen_US
dc.subjectFaulty hardwareen_US
dc.subjectIdeal testingen_US
dc.subjectModel based testingen_US
dc.subjectModel-based OPCen_US
dc.subjectMutation testingen_US
dc.subjectTest generationsen_US
dc.subjectTest sequenceen_US
dc.subjectTest theoriesen_US
dc.subjectSoftware testingen_US
dc.titleModel-based ideal testing of hardware description language (HDL) programsen_US
dc.typeArticleen_US
dc.institutionauthor-
dc.departmentİzmir Institute of Technologyen_US
dc.identifier.volume21en_US
dc.identifier.issue3en_US
dc.identifier.startpage1209en_US
dc.identifier.endpage1240en_US
dc.identifier.scopus2-s2.0-85118838250en_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.identifier.doi10.1007/s10270-021-00934-6-
dc.authorscopusid55807841400-
dc.authorscopusid57193648156-
dc.authorscopusid57200611344-
dc.authorscopusid55910368200-
dc.identifier.wosqualityQ3-
dc.identifier.scopusqualityQ2-
item.fulltextNo Fulltext-
item.grantfulltextnone-
item.languageiso639-1en-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
item.openairetypeArticle-
crisitem.author.dept03.04. Department of Computer Engineering-
Appears in Collections:Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
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