Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/14151
Title: Software Product Line Testing based on Event Sequence Graphs with Feature Expressions
Authors: Kaya, D.O.
Tuglular, T.
Belli, F.
Keywords: event sequence graphs
feature expression
software product lines
Software design
Case-studies
Event sequence graphs
Exponentials
Feature expression
Model-based OPC
Product configuration
Software Product Line
Software product line testing
Test sequence
Software testing
Publisher: Institute of Electrical and Electronics Engineers Inc.
Abstract: Software Product Line testing is by its nature challenging, especially due to the exponential rise in the number of assets that need to be verified. Scalability and efficient verification, two challenges that model-based SPL testing must deal with, are discussed in this paper. An approach to automatically obtaining test suites for software product lines is proposed as a solution to these challenges. By exploiting Event Sequence Graphs with Feature Expressions, which concisely depict the Software Product Line behavior, the proposed approach automatically generates test sequences for different product configurations. The presented approach is applied to the illustrative case studies from the literature. © 2023 IEEE.
Description: 8th International Conference on Computer Science and Engineering, UBMK 2023 -- 13 September 2023 through 15 September 2023 -- 193873
URI: https://doi.org/10.1109/UBMK59864.2023.10286660
https://hdl.handle.net/11147/14151
ISBN: 9798350340815
Appears in Collections:Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection

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