Browsing by Subject Ellipsometry
Showing results 1 to 4 of 4
| Issue Date | Title | Author(s) |
|---|---|---|
| 2014 | Characterization of molecular beam epitaxially crown CdTe layers over GaAs by spectroscopic ellipsometry | Günnar, Merve |
| 28-Nov-2008 | Electrical and dielectrical properties of tantalum oxide films grown by Nd:YAG laser assisted oxidation | Aygün, Gülnur ; Turan, Raşit |
| Jun-2017 | Molecular beam epitaxial growth of ZnSe on (211)B GaAs | Yavaş, Begüm |
| 1-Jul-2016 | Surface roughness estimation of MBE grown CdTe/GaAs(211)B by ex-situ spectroscopic ellipsometry | Karakaya, Merve ; Bilgilisoy, Elif ; Arı, Ozan ; Selamet, Yusuf |