Browsing "Physics / Fizik" by Subject Rapid thermal annealing
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| Issue Date | Title | Author(s) |
|---|---|---|
| Jun-2010 | Structural and electrical characterization of the nickel silicide films formed at 850 °C by rapid thermal annealing of the Ni/Si(1 0 0) films | Utlu, G.; Artunç, N.; Budak, S.; Tarı, Süleyman |