Browsing by Subject Depth profiling
Showing results 1 to 2 of 2
| Issue Date | Title | Author(s) |
|---|---|---|
| Feb-2010 | Evolution of SiO2/Ge/HfO2(Ge) multilayer structure during high temperature annealing | Şahin, D.; Yıldız, İlker; Gençer İmer, Arife; Aygün, Gülnur ; Slaoui, A.; Turan, Raşit |
| Sep-2004 | ToF-SIMS depth profiling analysis of the uptake of Ba2+ and Co2+ ions by natural kaolinite clay | Shahwan, Talal ; Erten, Hasan N.; Black, Leon; Allen, Geoffrey Charles |