Browsing by Author Basa, Deepak Kumar
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| Issue Date | Title | Author(s) |
|---|---|---|
| 28-Aug-2014 | In-situ spectroscopic ellipsometry and structural study of HfO2 thin films deposited by radio frequency magnetron sputtering | Cantaş, Ayten; Özyüzer, Gülnur Aygün; Basa, Deepak Kumar |