Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/2564
Title: Birleşimsel devreler için otomatik test örüntüsü oluşturma
Other Titles: Fourier analysis-based automatic test pattern generation for combinational circuits
Authors: Ayav, Tolga
Keywords: Birleşimsel devre
Fourier analizi
Otomatik test örüntüsü oluşturma
Automatic test pattern generation
Combinational circuit
Fourier analysis
Walsh transformation
Publisher: Institute of Electrical and Electronics Engineers Inc.
Source: Ayav, T. (2015, May 16-19). Birleşimsel devreler için otomatik test örüntüsü oluşturma. Paper presented at the 23rd Signal Processing and Communications Applications Conference. doi:10.1109/SIU.2015.7129939
Abstract: Boole işlevlerinin Fourier analizi son on yılda bilgisayar bilimlerinde oldukça ilgi çeken bir konu olmasına ragmen henüz çok az uygulama alanı bulabilmiştir. Bu çalışma birleşimsel mantık devrelerinin testi için Fourier analizi tabanlı bir otomatik test örüntüsü oluşturma metodu sunmaktadır.
Fourier analysis of boolean functions has attracted great attention from computer scientists in the last decade but it still has few application areas. This work presents a Fourier analysis-based automatic test pattern generation method for combinational circuits.
Description: 23rd Signal Processing and Communications Applications Conference, SIU 2015; Inonu UniversitesiMalatya; Turkey; 16 May 2015 through 19 May 2015
URI: http://doi.org/10.1109/SIU.2015.7129939
http://hdl.handle.net/11147/2564
ISBN: 9781467373869
Appears in Collections:Computer Engineering / Bilgisayar Mühendisliği
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection

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