Show simple item record

dc.contributor.authorOzan, Ş.
dc.contributor.authorGümüştekin, Ş.
dc.date.accessioned2021-02-12T18:43:47Z
dc.date.available2021-02-12T18:43:47Z
dc.date.issued2010
dc.identifier.isbn9781424496716
dc.identifier.urihttps://doi.org/10.1109/SIU.2010.5650225
dc.identifier.urihttps://hdl.handle.net/11147/9736
dc.description18th IEEE Signal Processing and Communications Applications Conference, SIU 2010en_US
dc.description.abstractThe bi-directional reflectance distribution function (BRDF) describes the appearance of a material by its interaction with light. In this study, Lafortune BRDF model is fitted to densely sampled measured BRDF data by using Levenberg - Marquardt Algorithm. The obtained results are visualised by a physically based ray tracing software and the proposed method is analysed. ©2010 IEEE.en_US
dc.language.isoturen_US
dc.relation.isversionof10.1109/SIU.2010.5650225en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.titleEfficient representation of measured BRDF data using Lafortune model [Ölçülmüş ÇYDF verilerinin Lafortune modeli ile etkin gösterimi]en_US
dc.typeconferenceObjecten_US
dc.typeconferenceObjecten_US
dc.relation.journalSIU 2010 - IEEE 18th Signal Processing and Communications Applications Conferenceen_US
dc.contributor.departmentIzmir Isntitute of Technologyen_US
dc.identifier.startpage684en_US
dc.identifier.endpage687en_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record