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dc.contributor.authorBalantekin, Müjdat
dc.date.accessioned2019-10-31T06:48:01Z
dc.date.available2019-10-31T06:48:01Z
dc.date.issued2013en_US
dc.identifier.isbn9781482205817
dc.identifier.urihttps://hdl.handle.net/11147/7321
dc.descriptionNanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites - 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013; Washington, DC; United States; 12 May 2013 through 16 May 2013en_US
dc.description.abstractWe analyze the high-speed operating method that we recently developed to be used in noncontact atomic force microscopes (AFM). We simulated the method on various samples and it is shown that the method can minimize the time spent for noncontact AFM imaging experiments. The initial simulation results showed that even with an ordinary AFM cantilever imaging speeds faster than 10 frames/second can be achieved.en_US
dc.description.sponsorshipTUBITAK (Grant No:110T732)en_US
dc.language.isoengen_US
dc.publisherCRC Pressen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectAtomic force microscopeen_US
dc.subjectEigenmode of a cantileveren_US
dc.subjectHigh-speed AFM imagingen_US
dc.subjectNoncontact modeen_US
dc.titleHigh-speed imaging in noncontact atomic force microscopyen_US
dc.typeconferenceObjecten_US
dc.contributor.institutionauthorBalantekin, Müjdat
dc.relation.journalNanotechnology 2013: Advanced Materials, CNTs, Particles, Films and Composites - 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013en_US
dc.contributor.departmentIzmir Institute of Technology. Electronics and Communication Engineeringen_US
dc.identifier.volume1en_US
dc.identifier.startpage1en_US
dc.identifier.endpage4en_US
dc.identifier.scopusSCOPUS:2-s2.0-84881101541
dc.relation.tubitakinfo:eu-repo/grantAgreement/TUBITAK/TBAG/110T732
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US


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