Show simple item record

dc.contributor.authorÇetinel, A.
dc.contributor.authorÖzdoğan, M.
dc.contributor.authorUtlu, G.
dc.contributor.authorArtunç, N.
dc.contributor.authorŞahin, G.
dc.contributor.authorTarhan, Enver
dc.date.accessioned2017-11-17T08:59:44Z
dc.date.available2017-11-17T08:59:44Z
dc.date.issued2017-08
dc.identifier.citationÇetinel, A., Özdoğan, M., Utlu, G., Artunç, N., Şahin, G.,and Tarhan, E. (2017). The effect of thickness of silver thin film on structural and optical properties of porous silicon. Surface Review and Letters, 24(6). doi:10.1142/S0218625X17500743en_US
dc.identifier.issn0218-625X
dc.identifier.urihttp://doi.org/10.1142/S0218625X17500743
dc.identifier.urihttp://hdl.handle.net/11147/6478
dc.description.abstractIn this study, porous silicon (PS) samples were prepared on n-type silicon (100) wafers by electrochemical etching method, varying the current density from 20 to 100mA/cm2 and keeping constant HF concentration (10%) and etching time of 15min. Then, Ag thin films, which have 10, 50 and 100nm film thicknesses, were deposited on PS layers by using thermal evaporation to investigate the influence of Ag film thickness on structural and optical properties of PS. The structural and optical properties of PS and Ag deposited PS layers have been investigated by XRD, FE-SEM, Raman and photoluminescence (PL) spectroscopy. FE-SEM XRD and Raman analyzes indicate that average pore size and porosity of PS layers increase with the increasing current density. Further, Ag nanoparticles have embedded in pore channel. PL measurement reveals that higher porosity of PS would be better to form the Ag-PS nano-composite material leading to stronger PL band. The PL spectra of PS and Ag-PS samples indicate that PL bands show blue shift with increasing current density and film thickness. Consequently, it has been found that the structural and optical properties of PS depend on current density and Ag film thickness individually.en_US
dc.description.sponsorshipEge University, Research Project Foundation (2013FEN058)en_US
dc.language.isoengen_US
dc.publisherWorld Scientific Publishingen_US
dc.relation.isversionof10.1142/S0218625X17500743en_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectCrystal structureen_US
dc.subjectLuminescenceen_US
dc.subjectSemiconductorsen_US
dc.subjectRaman spectroscopyen_US
dc.subjectThin filmsen_US
dc.titleThe effect of thickness of silver thin film on structural and optical properties of porous siliconen_US
dc.typearticleen_US
dc.contributor.authorIDTR130905en_US
dc.contributor.institutionauthorŞahin, G.
dc.contributor.institutionauthorTarhan, Enver
dc.relation.journalSurface Review and Lettersen_US
dc.contributor.departmentİYTE, Fen Fakültesi, Fizik Bölümüen_US
dc.identifier.volume24en_US
dc.identifier.issue6en_US
dc.identifier.wosWOS:000406285800002
dc.identifier.scopusSCOPUS:2-s2.0-85001124981
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record