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High-speed dynamic atomic force microscopy by using a Q-controlled cantilever eigenmode as an actuator
We present a high-speed operating method with feedback to be used in dynamic atomic force microscope (AFM) systems. In this method we do not use an actuator that has to be employed to move the tip or the sample as in conventional AFM setups. Instead, we utilize a Q-controlled eigenmode of an AFM cantilever to perform the function of the actuator. Simulations show that even with an ordinary tapping-mode cantilever, imaging speed can be increased by about 2 orders of magnitude compared to conventional dynamic AFM imaging.
- Electrical - Electronic Engineering / Elektrik - Elektronik Mühendisliği 
- Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection 
- WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection 
- PubMed İndeksli Yayınlar Koleksiyonu / PubMed Indexed Publications Collection