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| Automatic test pattern generation (1) |
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| Walsh transformation (1) |
Now showing items 1-7 of 1
| Automatic test pattern generation (1) |
| Birleşimsel devre (1) |
| Combinational circuit (1) |
| Fourier analizi (1) |
| Fourier analysis (1) |
| Otomatik test örüntüsü oluşturma (1) |
| Walsh transformation (1) |
