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dc.contributor.authorOkur, Salih
dc.contributor.authorYakuphanoğlu, Fahrettin
dc.contributor.authorÖzsöz, Mehmet
dc.contributor.authorKadayıfcılar, Pınar Kara
dc.date.accessioned2016-10-26T07:46:49Z
dc.date.available2016-10-26T07:46:49Z
dc.date.issued2009-11
dc.identifier.citationOkur, S., Yakuphanoğlu, F., Özsöz, M., and Kadayıfcılar, P.K. (2009). Electrical and interface properties of Au/DNA/n-Si organic-on-inorganic structures. Microelectronic Engineering, 86(11), 2305-2311. doi:10.1016/j.mee.2009.04.017en_US
dc.identifier.issn0167-9317
dc.identifier.urihttp://dx.doi.org/10.1016/j.mee.2009.04.017
dc.identifier.urihttp://hdl.handle.net/11147/2327
dc.description.abstractThe effect of the thickness and coverage rate of a DNA film on the electrical and interface properties of Au/DNA/n-Si organic-on-inorganic structures has been investigated. The thin film properties of the DNA deposited on n-Si wafer were characterized by atomic force microscopy. The effect of the thickness and coverage rate of the DNA layer was investigated by evaluating electrical parameters, such as the barrier height, ideality factor, series resistance, and interface state density. The thickness and coverage rate of the DNA layer significantly affects the electrical properties of the Au/DNA/n-Si organic-on-inorganic structures. The interface state density properties of the Au/DNA/n-Si diodes were determined by conductance technique. The results show that the interface state density decreases with decrease in both film thickness and coverage rate of the DNA in an acetate buffer, modifying the electronic parameters of the Au/DNA/n-Si diodes.en_US
dc.description.sponsorshipDPT project number DPT2003K120390en_US
dc.language.isoengen_US
dc.publisherElsevieren_US
dc.relation.isversionof10.1016/j.mee.2009.04.017en_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectDNAen_US
dc.subjectIdeality factoren_US
dc.subjectOrganic/inorganic junctionen_US
dc.subjectSemiconducting silicon compoundsen_US
dc.titleElectrical and interface properties of Au/DNA/n-Si organic-on-inorganic structuresen_US
dc.typearticleen_US
dc.contributor.institutionauthorOkur, Salih
dc.relation.journalMicroelectronic Engineeringen_US
dc.contributor.departmentIzmir Institute of Technology. Physicsen_US
dc.identifier.volume86en_US
dc.identifier.issue11en_US
dc.identifier.startpage2305en_US
dc.identifier.endpage2311en_US
dc.identifier.wosWOS:000271363900031
dc.identifier.scopusSCOPUS:2-s2.0-69549111056
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US


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