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dc.contributor.authorGöktaş, Oktay
dc.contributor.authorIşık, Nebile
dc.contributor.authorOkur, Salih
dc.contributor.authorGüneş, Mehmet
dc.contributor.authorCarius, Reinhard
dc.contributor.authorKlomfaß, Josef
dc.contributor.authorFinger, Friedhelm
dc.date.accessioned2016-10-12T12:02:22Z
dc.date.available2016-10-12T12:02:22Z
dc.date.issued2006-04
dc.identifier.citationGöktaş, O., Işık, N., Okur, S., Güneş, M., Carius, R., Klomfaß, J., and Finger, F.(2006). Sub-bandgap optical absorption spectroscopy of hydrogenated microcrystalline silicon thin films prepared using hot-wire CVD (Cat-CVD) process. Thin Solid Films, 501(1-2), 121-124. doi:10.1016/j.tsf.2005.07.137en_US
dc.identifier.issn0040-6090
dc.identifier.urihttp://doi.org/10.1016/j.tsf.2005.07.137
dc.identifier.urihttp://hdl.handle.net/11147/2221
dc.descriptionProceedings of the Third International Conference on Hot-Wire; 23 August 2004 through 27 August 2004en_US
dc.description.abstractHydrogenated microcrystalline silicon (μc-Si:H) thin films with different silane concentration (SC) have been prepared using the HW-CVD technique. Dual beam photoconductivity (DBP), photothermal deflection spectroscopy (PDS), and transmission measurements have been used to investigate the optical properties of the μc-Si:H films. Two different sub-bandgap absorption, α(hν), methods have been applied and analyzed to obtain a better insight into the electronic states involved. A good agreement has been obtained in the absorption spectrum obtained from the PDS and DBP measurements at energies above the bandgap. Differences between PDS and DBP spectra exist below the bandgap energy where DBP spectra always give lower α(hν) values and show a dependence on the SC. For some films, differences exist in the α(hν) spectra when the DBP measurements are carried out through the film and substrate side. In addition, for some films, there remains fringe pattern left on the spectrum after the calculation of the fringe-free absorption spectrum, which indicates structural inhomogeneities present throughout the film.en_US
dc.description.sponsorshipTÜBİTAK project number TBAG-U/14en_US
dc.language.isoengen_US
dc.publisherElsevieren_US
dc.relation.isversionof10.1016/j.tsf.2005.07.137en_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectCrystalline materialsen_US
dc.subjectElectrical properties and measurementsen_US
dc.subjectHot-wire depositionen_US
dc.subjectMicrocrystalline silicon thin filmsen_US
dc.subjectThin filmsen_US
dc.titleSub-bandgap optical absorption spectroscopy of hydrogenated microcrystalline silicon thin films prepared using hot-wire CVD (Cat-CVD) processen_US
dc.typeconferenceObjecten_US
dc.contributor.authorIDTR31998en_US
dc.contributor.authorIDTR166758en_US
dc.contributor.authorIDTR1299en_US
dc.contributor.institutionauthorGöktaş, Oktay
dc.contributor.institutionauthorIşık, Nebile
dc.contributor.institutionauthorOkur, Salih
dc.contributor.institutionauthorGüneş, Mehmet
dc.relation.journalThin Solid Filmsen_US
dc.contributor.departmentIzmir Institute of Technology. Physicsen_US
dc.identifier.volume501en_US
dc.identifier.issue1-2en_US
dc.identifier.startpage121en_US
dc.identifier.endpage124en_US
dc.identifier.wosWOS:000235979600029
dc.identifier.scopusSCOPUS:2-s2.0-32644476688
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US


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