Please use this identifier to cite or link to this item: https://hdl.handle.net/11147/5389
Title: High-speed tapping-mode atomic force microscopy using a Q-controlled regular cantilever acting as the actuator: Proof-of-principle experiments
Authors: Balantekin, Müjdat
Satır, Sarp
Torello, David
Değertekin, F. L.
Balantekin, Müjdat
Izmir Institute of Technology. Electronics and Communication Engineering
Keywords: AFM
Eigen modes
Atomic force microscopy
Nanocantilevers
Actuators
Tapping modes
Issue Date: Dec-2014
Publisher: American Institute of Physics
Source: Balantekin, M., Satır, S., Torello, D., and Değertekin, F.L. (2014). High-speed tapping-mode atomic force microscopy using a Q-controlled regular cantilever acting as the actuator: Proof-of-principle experiments. Review of Scientific Instruments, 85(12). doi:10.1063/1.4903469
Abstract: We present the proof-of-principle experiments of a high-speed actuationmethod to be used in tapping-mode atomic force microscopes (AFM). In this method, we do not employ a piezotube actuator to move the tip or the sample as in conventional AFM systems, but, we utilize a Q-controlled eigenmode of a cantilever to perform the fast actuation. We show that the actuation speed can be increased even with a regular cantilever.
URI: https://doi.org/10.1063/1.4903469
http://hdl.handle.net/11147/5389
ISSN: 0034-6748
10897623
Appears in Collections:Electrical - Electronic Engineering / Elektrik - Elektronik Mühendisliği
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection

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