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dc.contributor.authorGökçe, Tuncay C.
dc.contributor.authorAytaç, Sıtkı
dc.contributor.authorGökçe, Tumay
dc.date.accessioned2016-05-02T12:18:18Z
dc.date.available2016-05-02T12:18:18Z
dc.date.issued2001-10
dc.identifier.citationGökçe, T. C., Aytaç, S., and Gökçe, T. (2001, October). Determination of dose profile data with film dosimetry. Paper presented at the Proceedings of the 23rd Annual EMBS International Conference, İstanbul, Turkey, (pp. 3923-3924). Piscataway, N.J. : Institute of Electrical and Electronics Engineers.en_US
dc.identifier.urihttp://doi.org/10.1109/IEMBS.2001.1019699
dc.identifier.urihttp://hdl.handle.net/11147/4586
dc.description.abstractAlmost all external radiotherapy planning systems use dose profile data. There are various methods to measure these profiles. Direct measurements with semiconductor detectors are widely used. But this method takes lots of time especially at linear accelerators. We developed a simple method for this purpose. Dose profiles are measured with using radiographic films and verification films. Suitable modifications are done with derived sensitometric curve. Results are compared with original profiles. For the Co60, this method is found as an alternative to other methods with acceptable accuracy (%±2)en_US
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.relation.isversionof10.1109/IEMBS.2001.1019699en_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectProfileen_US
dc.subjectOARen_US
dc.subjectRadiotherapyen_US
dc.subjectFilmen_US
dc.titleDetermination of dose profile data with film dosimetryen_US
dc.typeconferenceObjecten_US
dc.contributor.institutionauthorGökçe, Tuncay C.
dc.contributor.institutionauthorAytaç, Sıtkı
dc.contributor.institutionauthorGökçe, Tumay
dc.relation.journalProceedings of the 23rd Annual EMBS International Conferenceen_US
dc.contributor.departmentIzmir Institute of Technology. Computer Engineeringen_US
dc.identifier.volume4en_US
dc.identifier.startpage3923en_US
dc.identifier.endpage3924en_US
dc.identifier.wosWOS:000178871901078
dc.identifier.scopusSCOPUS:2-s2.0-0035781376
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US


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