Browsing by Author Cantaş, Ayten

Showing results 1 to 10 of 10
Issue DateTitleAuthor(s)
Sep-2018Comparision of in situ spectroscopic ellipsometer and ex situ x-ray photoelectron spectroscopy depth profiling analysis of HfO2/Hf/Si multilayer structureCantaş, Ayten; Özyüzer, Lütfi ; Aygün, Gülnur
2019Effect of defects and secondary phases in Cu2ZnSnS4 absorber material on the performance of Zn(O,S) buffered devicesTürkoğlu, Fulya; Köseoğlu, Hasan; Cantaş, Ayten; Akça, Fatime G.; Meriç, Ece; Buldu, Dilara G.; Aygün, Gülnur
Jun-2011Effects of physical growth conditions on the structural and optical properties of sputtered grown thin HfO2 filmsAygün, Gülnur; Cantaş, Ayten; Şimşek, Yılmaz; Turan, Raşit
Nov-2010Ge nanocrystals embedded in SiO2 in MOS based radiation sensorsAktağ, Aliekber; Yılmaz, Ercan; Mogaddam, Nader A.P.; Aygün, Gülnur; Cantaş, Ayten; Turan, Raşit
Aug-2015Growth of Cu2ZnSnS4 absorber layer on flexible metallic substrates for thin film solar cell applicationsYazıcı, Şebnem; Olgar, Mehmet Ali; Akça, Fatime Gülşah; Cantaş, Ayten; Kurt, Metin; Aygün, Gülnur; Tarhan, Enver ; Yanmaz, Ekrem; Özyüzer, Lütfi 
Nov-2014Impact of incorporated oxygen quantity on optical, structural and dielectric properties of reactive magnetron sputter grown high-? HfO2/Hf/Si thin filmCantaş, Ayten; Aygün, Gülnur; Turan, Raşit
Jun-2018Importance of CdS buffer layer thickness on Cu2ZnSnS4-based solar cell efficiencyCantaş, Ayten; Türkoğlu, Fulya; Meriç, Ece; Akça, Fatime Gülşah; Özdemir, Mehtap; Tarhan, Enver ; Özyüzer, Lütfi ; Özyüzer, Gülnur Aygün
28-Aug-2014In-situ spectroscopic ellipsometry and structural study of HfO2 thin films deposited by radio frequency magnetron sputteringCantaş, Ayten; Özyüzer, Gülnur Aygün; Basa, Deepak Kumar
Jan-2018Influence of sulfurization temperature on Cu2ZnSnS4 absorber layer on flexible titanium substrates for thin film solar cellsBuldu, Dilara Gökçen; Cantaş, Ayten; Türkoğlu, Fulya; Akça, Fatime Gülşah; Meriç, Ece; Özdemir, Mehtap; Tarhan, Enver ; Özyüzer, Lütfi ; Aygün, Gülnur
2010Production and characterization of HfO2 high-k dielectric layers by sputtering techniqueCantaş, Ayten