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dc.contributor.authorTopal, Ozan Alp
dc.contributor.authorKarabulut Kurt, Güneş
dc.contributor.authorÖzbek, Berna
dc.date.accessioned2019-03-01T12:32:44Z
dc.date.available2019-03-01T12:32:44Z
dc.date.issued2017-12
dc.identifier.citationTopal, O. A. Karabulut Kurt, G., and Özbek, B. (2017). Key error rates in physical layer key generation: Theoretical analysis and measurement-based verification. IEEE Wireless Communications Letters, 6(6), 766-769. doi:10.1109/LWC.2017.2740290en_US
dc.identifier.issn2162-2337
dc.identifier.urihttp://doi.org/10.1109/LWC.2017.2740290
dc.identifier.urihttp://hdl.handle.net/11147/7135
dc.description.abstractChannel gains are frequently used to obtain a secret key that can be used for encryption in physical layer security systems. However, the channel gains captured by the nodes may not always be the same due to channel estimation errors. This would result in a non-zero key error rate (KER). In this letter, we obtain theoretical expressions for KER in orthogonal frequency division multiplexing systems. Tight KER approximations are provided based on Gauss-Laguerre quadrature. A measurementbased study is conducted by using software defined radio nodes to demonstrate the validity and the practicality of the provided results.en_US
dc.description.sponsorshipTUBITAK (114E626)en_US
dc.language.isoengen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.relationinfo:eu-repo/grantAgreement/TUBITAK/EEEAG/114E626en_US
dc.relation.isversionof10.1109/LWC.2017.2740290en_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectKey error rateen_US
dc.subjectKey extractionen_US
dc.subjectPhysical layer key generationen_US
dc.subjectPhysical layer securityen_US
dc.titleKey error rates in physical layer key generation: Theoretical analysis and measurement-based verificationen_US
dc.typearticleen_US
dc.contributor.authorIDTR36682en_US
dc.contributor.iztechauthorÖzbek, Berna
dc.relation.journalIEEE Wireless Communications Lettersen_US
dc.contributor.departmentIzmir Institute of Technology. Electronics and Communication Engineeringen_US
dc.identifier.volume6en_US
dc.identifier.issue6en_US
dc.identifier.startpage766en_US
dc.identifier.endpage769en_US
dc.identifier.wosWOS:000418645700017
dc.identifier.scopusSCOPUS:2-s2.0-85028458550
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US


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