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Browsing Materials Science and Engineering / Malzeme Bilimi ve Mühendisliği by Author "Bilgilisoy, Elif"
Molecular beam epitaxy (MBE) growth of thin (∼2 μm) CdTe layers characterized by high crystal quality and low defect density on lattice mismatched substrates, such as GaAs and Si, has thus far been difficult to achieve. ...
Karakaya, Merve; Bilgilisoy, Elif; Arı, Ozan; Selamet, Yusuf (American Institute of Physics Publishing, 2016-07-01)Spectroscopic ellipsometry (SE) ranging from 1.24 eV to 5.05 eV is used to obtain the film thickness and optical properties of high index (211) CdTe films. A three-layer optical model (oxide/CdTe/GaAs) was chosen for the ...