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dc.contributor.authorÖzyüzer, Lütfi
dc.contributor.authorKurter, Cihan
dc.contributor.authorZasadzinski, John F.
dc.contributor.authorGray, Kenneth E.
dc.contributor.authorHinks, David G.
dc.contributor.authorMiyakawa, Nobuaki
dc.date.accessioned2016-07-21T11:15:14Z
dc.date.available2016-07-21T11:15:14Z
dc.date.issued2005-05
dc.identifier.citationÖzyüzer, L., Kurter, C., Zasadzinski, J.F., Gray, K.E., Hinks, D.G., and Miyakawa, N. (2005). Comparison of intrinsic Josephson and SIS tunneling spectroscopy of Bi 2Sr2CaCu2O8+δ. IEEE Transactions on Applied Superconductivity, 15(2 PART I), 181-184. doi:10.1109/TASC.2005.849743en_US
dc.identifier.issn1051-8223
dc.identifier.urihttps://doi.org/10.1109/TASC.2005.849743
dc.identifier.urihttp://hdl.handle.net/11147/1953
dc.description.abstractTunneling spectroscopy measurements are reported on optimally-doped and overdoped Bi2Sr2Ca2Cu2O 8+δ single crystals. A novel point contact method is used to obtain superconductor-insulator-normal metal (SIN) and SIS break junctions as well as intrinsic Josephson junctions (IJJ) from nanoscale crystals. Three junction types are obtained on the same crystal to compare the quasiparticle peaks and higher bias dip/hump structures which have also been found in other surface probes such as scanning tunneling spectroscopy and angle-resolved photoemission spectroscopy. However, our IJJ quasiparticle spectra consistently reveal very sharp conductance peaks and no higher bias dip structures. The IJJ conductance peak voltage divided by the number of junctions in the stack consistently leads to a significant underestimate of Δ when compared to the single junction values. The comparison of the three methods suggests that the markedly different characteristics of IJJ are a consequence of nonequilibrium effects and are not intrinsic quasiparticle features.en_US
dc.language.isoengen_US
dc.publisherIEEEen_US
dc.relation.isversionof10.1109/TASC.2005.849743en_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectHigh-Tc superconductorsen_US
dc.subjectIntrinsic Josephson junctionsen_US
dc.subjectSpectroscopic analysisen_US
dc.subjectTunneling spectroscopyen_US
dc.titleComparison of intrinsic Josephson and SIS tunneling spectroscopy of Bi 2Sr2CaCu2O8+δen_US
dc.typeconferenceObjecten_US
dc.contributor.authorIDTR5135en_US
dc.contributor.iztechauthorÖzyüzer, Lütfi
dc.contributor.iztechauthorKurter, Cihan
dc.relation.journalIEEE Transactions on Applied Superconductivityen_US
dc.contributor.departmentİYTE, Fen Fakültesi, Fizik Bölümüen_US
dc.identifier.volume15en_US
dc.identifier.issue2 PART Ien_US
dc.identifier.startpage181en_US
dc.identifier.endpage184en_US


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